2025 年第 8 期 第 20 卷

心脏植入式电子设备术后亚临床心房颤动研究进展

Research progress of subclinical atrial fibrillation after cardiac implantable electronic devices

作者：殷荣荣1李刚2任学军1

英文作者：Yin Rongrong1 Li Gang2 Ren Xuejun1

单位：1首都医科大学附属北京安贞医院心内科，北京100029；2首都医科大学附属北京安贞医院小儿心脏中心，北京100029

英文单位：1Department of Cardiology Beijing Anzhen Hospital Capital Medical University Beijing 100029 China; 2Pediatric Heart Center Beijing Anzhen Hospital Capital Medical University Beijing 100029 China

关键词：亚临床心房颤动；心脏植入式电子设备；脑卒中

英文关键词：Subclinicalatrialfibrillation；Cardiacimplantableelectronicdevices；Stroke

• 摘要：

• 房性心动过速中最常见的持续性类型是心房颤动，心功能不全和脑卒中是患者面临的主要风险。近年来，随着心脏植入式电子设备（CIEDs）持续监测心房电活动后发现一种早期的无症状心房颤动，称为亚临床心房颤动，它导致血栓栓塞风险增加，以往仅在缺血性脑卒中或充血性心力衰竭等并发症发生后才被发现。本综述将围绕CIEDs相关亚临床心房颤动的定义、发病率、危险因素、卒中关系、抗凝展开讨论，概述其进展。

• The most common persistent type of atrial tachycardia is atrial fibrillation, and cardiac dysfunction and stroke are the major risks for patients. In recent years, with the continuous monitoring of atrial electrical activity by cardiac implantable electronic devices (CIEDs), an early asymptomatic atrial fibrillation, called subclinical atrial fibrillation, has been found, which leads to an increased risk of thromboembolism. It was previously only found after the occurrence of complications such as ischemic stroke or congestive heart failure. This review will discuss the definition, incidence, risk factors, stroke relationship, and anticoagulation of subclinical atrial fibrillation associated with CIEDs, and summarize its progress.